Volume 14 Issue 1 (2003)
Page 3
Eastern Analytical Symposium. Back Home (where it belongs)
Fred McClure
North American Editor
Pages 3–5
18th Tsukuba Meeting
Sumio Kawano
Japanese Editor
Page 5
Q-Interline User Group Meeting
Dr Eigil Dåbakk
Q-Interline AB, Upplands Väsby, Sweden
Pages 6–7
NIR in Industry. Discussions of practical issues: Ways to use data treatments to correct for sampling problems
Lois Weyer
ATK Tactical Systems Company, LLC, 55 Thiokol Rd, Elkton, MD, USA
Page 8
IDRC Honorary Member. Honorary Fellow's response
Robert D. Rosenthal
Page 9
Instrument Info. A standard test or a test of a standard? The Foss XDS
A.M.C. Davies
Norwich Near Infrared Consultancy, 75 Intwood Road, Cringleford, Norwich NR4 6AA
Pages 10–12
EAS Award Presentation Article. NIR spectral characteristics (part 1)
Jerry Workman
Argose Inc., Waltham, MA 02445, USA
Page 13
ICNIRS Page
ICNRS Members
Page 14
Spreading the word
Tom Fearn
Department of Statistical Science, University College London,Gower Street, London WC1E 6BT, UK
Page 15
Advertisement. Too much data - too little information!
Harald Martens
Centre for Advanced Food Studies, Denmark