Volume 15 Issue 1 (2004)
Page 3
EAS Report 2003. Somerset, New Jersey, USA
Fred McClure
North Carolina State University, Raleigh, North Carolina, USA
Page 3
News.
Editorial Staff
Pages 4–7
Competing theories of diffuse reflectance
Donald J. Dahm
Department of Chemistry and Physics, Rowan University, Glassboro, New Jersey, USA
Page 6
NIR in Industry. Discussions of practical issues: Real sample sets
Lois Weyer
ATK Elkton, LLC, 55 Thiokol, Elkton, MD, USA
Page 8
Tsukuba Report. The 19th National NIR Meeting
Sumio Kawano and Sirinnapa Saranwong
Nondestructive Evaluation Laboratory, National Food Research. Institute, 2-1-12 Kannondai, Tsukuba 305-8642, Japan
Pages 10–13
EAS Award Lecture. “The rest of the story ”
Howard Mark
Mark Electronics, 69 Jamie Court, Suffern, NY 10901, USA
Pages 14–15
Fitting equations with more than one intercept
Tom Fearn
Department of Statistical Science, University College London, Gower Street, London WC1E 6BT, UK
Page 16
New ASTM Activity on Pharmaceutical Application of Process Analytical Technology
Jim Drennen
Duquesne University Center for Pharceutical Technology, Pittsburgh, PA 15282, USA, E-mail: drennen@duq.edu